University of Illinois Urbana-Champaign
Illinois Materials Research Science and Engineering Center
The Bruker D8 Advance diffractometer includes a vertical theta/theta goniometer with independent rotation of the x-ray tube, x-ray detector, sample stage tilt and spinning. All major x-ray diffraction (XRD) and reflectivity (XRR) applications are available in this system.
Multi-chamber glove box with an in-situ microscope, 2D material transfer station, spinner and thermal evaporator. This integrated system allows for the manufacture of ultra-clean 2D heterostructures and devices and working with air-sensitive nanomaterials.
This system is used to study the magneto-optic response and heat capacity of materials through time-domain thermoreflectance and magneto-optic Kerr effect measurements. A scanning imaging system that uses the infrared output of the OPO system enables fast and high-resolution imaging of magnetic order. This tool is located in the MRL laser facility.
This is a multi-target sputter deposition system for synthesizing magnetic thin films. This tool is located in the MRL central facilities in room 336 MRL.
The XploRA PLUS Raman Microscope head-based tip-enhanced Raman spectroscopy (TERS) and tip enhanced photoluminescence (TEPL) from Horiba, Inc. is a fully integrated TERS/TEPL system based on SmartSPM state of the art scanning probe microscope (SPM) and XploRA Raman micro-spectrometer.
The Electron Microscope Pixel Array Detector (EMPAD) is a pixelated detector for applications as 4D STEM acquiring diffraction pattern in each point of a map at a speed of up to 1,100 diffraction patterns per second.
The Quantum Design MPMS3 is a third-generation Magnetic Property Measurement System (MPMS) which uses a Superconducting Quantum Interference Device (SQUID) to measure the bulk magnetic moment of samples with < 10-8 emu sensitivity.
The Quantum Design MPMS3 is a third-generation Magnetic Property Measurement System (MPMS) which uses a Superconducting Quantum Interference Device (SQUID) to measure the bulk magnetic moment of samples with < 10-8 emu sensitivity.
The NT-MDT AFM has built in all the standard scanned probe measurement capabilities including topography imaging, nanomechanical indentation and shear, and electrical imaging. It is primarily used for topography analysis of 2D materials and testing the cleanliness of 2D heterostructures.
The Tergeo Plasma Cleaner is capable of direct or indirect oxygen or hydrogen plasmas. It is primarily used for chemical modification of 2D material surfaces, e.g. oxidization of chalcogenides or hydrogenation of graphene.