The XploRA PLUS Raman Microscope head-based tip-enhanced Raman spectroscopy (TERS) and tip enhanced photoluminescence (TEPL) from Horiba, Inc. is a fully integrated TERS/TEPL system based on SmartSPM state of the art scanning probe microscope (SPM) and XploRA Raman micro-spectrometer. It uses a feedback light source with wavelength of 1300 nm. Filters at the feedback light source and detector avoid interference from the lasers used for spectroscopy. This instrument is located in the MRL central facilities in room 0022 Supercon.
Local and off-campus users interested in using these facilities should contact mrsec-info@illinois.edu to initiate the process.
This equipment was funded through the Illinois MRSEC NSF Award Number DMR-2309037. Its use should be acknowledged in any published works, with the wording: “The authors acknowledge the use of facilities and instrumentation at the Materials Research Laboratory Central Research Facilities, University of Illinois, partially supported by NSF through the University of Illinois Materials Research Science and Engineering Center DMR-2309037.” Please also send a copy of the publication (email or hard copy), or the publication information (citation, DOI, or conference name and paper/poster title) to mrsec-info@illinois.edu. Read more about this instrument’s features and capabilities, and how to access this instrument on the MRL website.