NT-MDT Atomic Force Microscope (AFM)

The NT-MDT AFM has built in all the standard scanned probe measurement capabilities including topography imaging, nanomechanical indentation and shear, and electrical imaging. It is primarily used for topography analysis of 2D materials and testing the cleanliness of 2D heterostructures.

This tool is located in room 350 MRL. Local users interested in using these facilities should contact Pamela Pena Martin (pmartin9@illinois.edu) to initiate the process. Those from off-campus interested in use of these facilities should contact Prof. Arend van der Zande (arendv@illinois.edu) to discuss this.