University of Illinois Urbana-Champaign
Illinois Materials Research Science and Engineering Center
Horiba XploRA-nano TERS/TEPL

The XploRA PLUS Raman Microscope head-based tip-enhanced Raman spectroscopy (TERS) and tip enhanced photoluminescence (TEPL) from Horiba, Inc. is a fully integrated TERS/TEPL system based on SmartSPM state of the art scanning probe microscope (SPM) and XploRA Raman micro-spectrometer. It uses a feedback light source with wavelength of 1300 nm. Filters at the feedback light source and detector avoid interference from the lasers used for spectroscopy. This instrument is located in the MRL central facilities in room 0022 Supercon.

Read more about this instrument’s features and capabilities, and how to access this instrument here: